FILM THICKNESS MEASURING METHOD AND DEVICE OF WET FILM, MANUFACTURING METHOD OF PHOTOCONDUCTIVE PHOTORECEPTOR USING METHOD AND DEVICE, AND PHOTOCONDUCTIVE PHOTORECEPTOR

摘要

PROBLEM TO BE SOLVED: To securely and precisely measure a light transmitting wet film formed on a surface of a coating object. SOLUTION: A coated substance in which the wet film is formed on a surface of the coating object provided with at least a hardened layer formed on a support substrate is made as a body to be measured. Light from a light source is guided by an irradiation light guiding fiber of a fiber probe (FP) and emitted from an emission part thereof. The emitted luminous flux is perpendicularly incident on the object to be measured by an objective lens of a condensing optical system and condensed on the wet film. Interference reflected light reflected by the outermost surface of the wet film and the outermost surface of the hardened layer is returned to an end face of a detection light transmission fiber of the (FP) via the objective lens, and is guided to a spectroscopic means by the detection light transmission fiber so as to be separated. The film thickness of the wet film is arithmetically calculated on the basis of respective wavelengths providing the minimum and the maximum of the obtained spectroscopic spectral intensity and a refractive index of the wet film. COPYRIGHT: (C)2007,JPO&INPIT