发明名称 SCANNED-BEAM IMAGER WITH PHASE OFFSET PHOTON EMISSION IMAGING
摘要 <p>Aspects of the subject matter described herein relate to attributing light emissions to spots a light was scanned over. In aspects, the scanned light includes light capable of increasing light emissions from at least one type of matter. A detector detects emitted light that comes from spots the light was previously scanned over. Circuitry attributes emitted light with spots within the area. Data representing light that reflects from each spot may be combined with data representing light that emits (if any) from each spot to create an image. The emitted light may be assigned a false color in the image to distinguish it from reflected light in the image. Emitted light may occur as a result of fluorescent activity. Other aspects are described in the specification.</p>
申请公布号 WO2007108993(A2) 申请公布日期 2007.09.27
申请号 WO2007US06194 申请日期 2007.03.12
申请人 MICROVISION, INC.;WIKLOF, CHRISTOPHER, A.;APPERSON, GERALD, R.;GIBSON, GREGORY, T. 发明人 WIKLOF, CHRISTOPHER, A.;APPERSON, GERALD, R.;GIBSON, GREGORY, T.
分类号 H01L27/00 主分类号 H01L27/00
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