发明名称 |
PROBE FOR TESTING ELECTRICITY CONDUCTION AND PROBE ASSEMBLY |
摘要 |
<p>A probe for testing electricity conduction, the probe being provided with a positioning mark having a predetermined relationship with a needle point. The positioning mark is on a surface that is in parallel with the surface where the needle point is provided, that is at a height recessed from the surface, and that faces the same direction as the surface. The positioning mark is, when viewed from the direction of projection of the needle point, includes information indicating the direction where the needle point is present.</p> |
申请公布号 |
WO2007108110(A1) |
申请公布日期 |
2007.09.27 |
申请号 |
WO2006JP305631 |
申请日期 |
2006.03.15 |
申请人 |
KABUSHIKI KAISHA NIHON MICRONICS;MIYAGI, YUJI;IWABUCHI, TETSUYA |
发明人 |
MIYAGI, YUJI;IWABUCHI, TETSUYA |
分类号 |
G01R1/073 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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