发明名称 PROBE FOR TESTING ELECTRICITY CONDUCTION AND PROBE ASSEMBLY
摘要 <p>A probe for testing electricity conduction, the probe being provided with a positioning mark having a predetermined relationship with a needle point. The positioning mark is on a surface that is in parallel with the surface where the needle point is provided, that is at a height recessed from the surface, and that faces the same direction as the surface. The positioning mark is, when viewed from the direction of projection of the needle point, includes information indicating the direction where the needle point is present.</p>
申请公布号 WO2007108110(A1) 申请公布日期 2007.09.27
申请号 WO2006JP305631 申请日期 2006.03.15
申请人 KABUSHIKI KAISHA NIHON MICRONICS;MIYAGI, YUJI;IWABUCHI, TETSUYA 发明人 MIYAGI, YUJI;IWABUCHI, TETSUYA
分类号 G01R1/073 主分类号 G01R1/073
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