| 摘要 |
<p>A method for aligning a radiographic inspection system 10 includes providing a radiation source 14 capable of emitting a beam pattern, positioning a detector 16 to receive radiation emitted from the radiation source 14, and causing the radiation source 14 to emit the beam pattern. The detector 16 is used to determine the distribution of flux intensity of the beam pattern. A two-dimensional or three-dimensional map of the beam pattern may be stored. The system 10 is aligned by positioning the radiation source 14 and the detector 16 with reference to the map, so that the detector 16 is disposed at a predetermined location within the beam pattern.</p> |
