发明名称 |
Programmable built-in self-test circuit for serializer/deserializer circuits and method |
摘要 |
A built-in self-test circuit for use in testing a serializer/deserializer circuit includes a programmable transmit register that transmits data to the serializer/deserializer circuit having programmably varying characteristics. The built-in self-test circuit includes the transmit register that transmits data to the serializer/deserializer for processing into processed data, a receive register that receives the processed data from the serializer/deserializer, and an error detector that detects errors in the processed data.
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申请公布号 |
US7275195(B2) |
申请公布日期 |
2007.09.25 |
申请号 |
US20030678511 |
申请日期 |
2003.10.03 |
申请人 |
AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. |
发明人 |
MARTINEZ ANTONIO MARROIG |
分类号 |
G01R31/28;G01R31/317;G01R31/3181;G01R31/3185 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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