发明名称 Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems
摘要 A sample sequestering system which allows access to a subspace in a chamber encompassed generally enclosed space, for use in entering and removing a sample when the subspace is opened to atmosphere. Sufficient purge gas is flowed from within the generally enclosed space into the subspace discourage atmospheric contaminates from entering into the subspace. Contained within the generally enclosed space is a spectrophotometer, ellipsometer or polarimeter or the like system which operates at wavelengths, (eg. UV), which are adversely affected, (eg. absorbed), by typical atmospheric contents.
申请公布号 US7274450(B1) 申请公布日期 2007.09.25
申请号 US20040857774 申请日期 2004.05.28
申请人 J.A. WOOLLAM CO., INC 发明人 GREEN STEVEN E.;HE PING;PFEIFFER GALEN L.;GUENTHER BRIAN D.;COONEY GERALD T.;WOOLLAM JOHN A.;LIPHARDT MARTIN M.;JOHS BLAINE D.;HERZINGER CRAIG M.
分类号 G01J4/00 主分类号 G01J4/00
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