| 摘要 |
The invention relates to a method and an arrangement of testing a device, such as a peripheral device, in a mobile station. The arrangement comprises a signal generator for generating a test signal for the device under test, a measurement unit integrated into the mobile station for measuring en electric quantity from a feeding line of the device under test, and an analyser for determining an electric response of the device to the test signal by using the electric quantity. According to the invention, at least a portion of the testing procedure composed of generating the test signal and determining the electric response of the device is performed using a functional unit, such as the signal generator or the analyser, integrated into the mobile station.
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