发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To execute an additional repair without providing another fuse box or complicating a transfer route in a method of compressing repair data and storing them into a fuse. SOLUTION: First repair data making to correspond a redundant circuit and a replacement information of a defective memory cell are compressed, and the first repair data arrayed in order of redundant circuits and second repair data making to correspond a redundant address for replacing a defective address not included in the first repair data are set in a plurality of fuses. Then, the first repair data are taken out and transferred as the repair data by decompressing them, and the defective address included in the second repair data is used as for the redundant address included in the second repair data. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007234155(A) 申请公布日期 2007.09.13
申请号 JP20060056238 申请日期 2006.03.02
申请人 SONY CORP 发明人 MORI HIROAKI;KOSASA TAKESHI
分类号 G11C29/04;G11C11/401 主分类号 G11C29/04
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