| 摘要 |
A testing pin assembly ( 200 ) is disclosed as including a pin ( 202 ) with a lower end, and a spring ( 206 ) electrically connected with the pin ( 202 ) via a connector ( 204 ), in which the connector ( 204 ) includes an upper surface ( 210 ) electrically connected with the lower end of the pin ( 202 ), and a lower end ( 212 ) of the connector ( 204 ) is partly received within a cavity of an end of the spring ( 206 ). An apparatus ( 300 ) for testing printed circuit boards ( 310 ) is disclosed as including the testing pin assembly ( 200 ), in which the spring ( 206 ) and the connector ( 204 ) are housed within a base ( 302 ), and the pin ( 202 ) extends through an opening ( 306 ) of a platform ( 308 ).
|
