发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING STEP OF REMOVING PHOTORESIST FILM OR THE LIKE AND PHOTORESIST FILM REMOVING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device including a step of removing a photoresist film or the like in which a photoresist film can be removed without requiring supply of a reactive gas and without requiring generation of plasma. SOLUTION: The method for manufacturing a semiconductor device includes a step of removing a photoresist film formed on a substrate, in which dry ice particles of a predetermined particle size are blasted at a predetermined pressure to the photoresist film while the substrate is heated to room temperature or higher, for example, 30 to 200°C and preferably around 100°C. Since the surface of the photoresist film after an ion implantation step is hardened, it is necessary to blast dry ice particles of a particle size as large as a certain degree at a pressure of as high as a certain degree. By heating the substrate, the dry ice particles blasted to the substrate vaporize to avoid damages to the substrate, and the photoresist film is effectively removed by the physical effect by the blasting pressure of the dry ice particles. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007232901(A) 申请公布日期 2007.09.13
申请号 JP20060052576 申请日期 2006.02.28
申请人 FUJITSU LTD 发明人 TAKAHASHI OSAMU;YAEGASHI TETSUO
分类号 G03F7/42;G03F7/40;H01L21/266;H01L21/302 主分类号 G03F7/42
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