发明名称 |
System for adjusting manufacturing equipment, method for adjusting manufacturing equipment, and method for manufacturing semiconductor device |
摘要 |
A system for adjusting a manufacturing equipment includes a measurement equipment configured to measure a plurality of sizes of portions of a product on a plane, an approximation module configured to approximate a planar distribution of the plurality of sizes by an orthogonal polynomial. as a function of coordinates on the plane, an association module configured to associate a plurality of terms in the orthogonal polynomial with a plurality of equipment parameters of the manufacturing equipment, respectively, the manufacturing equipment manufacturing the product, and an adjusting module configured to adjust the plurality of equipment parameters to reduce a plurality of distribution components, the plurality of distribution components composing the planar distribution approximated by the orthogonal polynomial.
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申请公布号 |
US2007212801(A1) |
申请公布日期 |
2007.09.13 |
申请号 |
US20070708344 |
申请日期 |
2007.02.21 |
申请人 |
KANNO MASAHIRO;ASANO MASAFUMI |
发明人 |
KANNO MASAHIRO;ASANO MASAFUMI |
分类号 |
H01L21/66;G06F19/00;H01L21/027 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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