发明名称 System for adjusting manufacturing equipment, method for adjusting manufacturing equipment, and method for manufacturing semiconductor device
摘要 A system for adjusting a manufacturing equipment includes a measurement equipment configured to measure a plurality of sizes of portions of a product on a plane, an approximation module configured to approximate a planar distribution of the plurality of sizes by an orthogonal polynomial. as a function of coordinates on the plane, an association module configured to associate a plurality of terms in the orthogonal polynomial with a plurality of equipment parameters of the manufacturing equipment, respectively, the manufacturing equipment manufacturing the product, and an adjusting module configured to adjust the plurality of equipment parameters to reduce a plurality of distribution components, the plurality of distribution components composing the planar distribution approximated by the orthogonal polynomial.
申请公布号 US2007212801(A1) 申请公布日期 2007.09.13
申请号 US20070708344 申请日期 2007.02.21
申请人 KANNO MASAHIRO;ASANO MASAFUMI 发明人 KANNO MASAHIRO;ASANO MASAFUMI
分类号 H01L21/66;G06F19/00;H01L21/027 主分类号 H01L21/66
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