发明名称 |
METHOD FOR MANUFACTURING SILICON CARBIDE SINGLE CRYSTAL INGOT, AND SILICON CARBIDE SINGLE CRYSTAL INGOT |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for producing an SiC single crystal ingot from which large-diameter, good-quality face ä0001} wafers almost free from dislocation defects can inexpensively be obtained with good reproducibility. SOLUTION: A part or the whole of silicon carbide single crystal 12 is grown using a seed crystal 1 by a sublimation-recrystallization method in such a state as to increase the electron concentration of the growing single crystal 12 to≥1×10<SP>19</SP>cm<SP>-3</SP>but≤6×10<SP>20</SP>cm<SP>-3</SP>. Thereby, the dislocation defect is reduced to obtain the high-quality, large-diameter silicon carbide single crystal ingot 12. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007230823(A) |
申请公布日期 |
2007.09.13 |
申请号 |
JP20060054420 |
申请日期 |
2006.03.01 |
申请人 |
NIPPON STEEL CORP |
发明人 |
OTANI NOBORU;KATSUNO MASAKAZU;TSUGE HIROSHI;NAKABAYASHI MASASHI;FUJIMOTO TATSUO;YASHIRO HIROKATSU;SAWAMURA MITSURU;AIGO TAKASHI;HOSHINO TAIZO |
分类号 |
C30B29/36;C23C16/34;C23C16/42;C30B23/02;C30B25/02;C30B29/38;H01L21/205 |
主分类号 |
C30B29/36 |
代理机构 |
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