发明名称 |
A REAL-TIME ADAPTIVE SRAM ARRAY FOR HIGH SEU IMMUNITY |
摘要 |
A system and method for automatically adjusting one or more electrical parameters in a memory device, e.g., SRAM arrays. The system and method implements an SRAM sensing sub-array for accelerated collection of fail rate data for use in determining the operating point for optimum tradeoff between single event upset immunity and performance of a primary SRAM array. The accelerated fail rate data is input to an algorithm implemented for setting the SEU sensitivity of a primary SRAM memory array to a predetermined fail rate in an ionizing particle environment. The predetermined fail rate is maintained on a real-time basis in order to provide immunity to SEU consistent with optimum performance.
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申请公布号 |
US2007211527(A1) |
申请公布日期 |
2007.09.13 |
申请号 |
US20060308215 |
申请日期 |
2006.03.13 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HSU LOUIS L.;MANDELMAN JACK A.;WONG ROBERT C.;YANG CHIH-CHAO |
分类号 |
G11C16/04 |
主分类号 |
G11C16/04 |
代理机构 |
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