发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a silicon carbide semiconductor device capable of applying more current per unit cell, i.e. capable of further reducing ON-resistance. SOLUTION: The silicon carbide semiconductor device has a drain region 3 consisting of an n-type silicon carbide semiconductor; a first base region 4 contacting the drain region 3 and consisting of a p-type silicon carbide semiconductor; a source region 5 contacting the first base region 4 and consisting of an n-type silicon carbide semiconductor; a second base region 6 contacting the source region 5 and consisting of a p-type silicon carbide semiconductor opposite to the first base region 4 via a predetermined region of the drain region 3; and a gate electrode 9 contacting the surface of the first base region sandwiched by at least the source region 5 and the drain region 3 via a gate insulating film. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007234938(A) 申请公布日期 2007.09.13
申请号 JP20060056033 申请日期 2006.03.02
申请人 NISSAN MOTOR CO LTD 发明人 TANAKA HIDEAKI;HOSHI MASAKATSU;HAYASHI TETSUYA;SHIMOIDA YOSHIO
分类号 H01L29/78;H01L21/337;H01L29/12;H01L29/80;H01L29/808 主分类号 H01L29/78
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