发明名称 |
SILICON CARBIDE SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a silicon carbide semiconductor device capable of applying more current per unit cell, i.e. capable of further reducing ON-resistance. SOLUTION: The silicon carbide semiconductor device has a drain region 3 consisting of an n-type silicon carbide semiconductor; a first base region 4 contacting the drain region 3 and consisting of a p-type silicon carbide semiconductor; a source region 5 contacting the first base region 4 and consisting of an n-type silicon carbide semiconductor; a second base region 6 contacting the source region 5 and consisting of a p-type silicon carbide semiconductor opposite to the first base region 4 via a predetermined region of the drain region 3; and a gate electrode 9 contacting the surface of the first base region sandwiched by at least the source region 5 and the drain region 3 via a gate insulating film. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007234938(A) |
申请公布日期 |
2007.09.13 |
申请号 |
JP20060056033 |
申请日期 |
2006.03.02 |
申请人 |
NISSAN MOTOR CO LTD |
发明人 |
TANAKA HIDEAKI;HOSHI MASAKATSU;HAYASHI TETSUYA;SHIMOIDA YOSHIO |
分类号 |
H01L29/78;H01L21/337;H01L29/12;H01L29/80;H01L29/808 |
主分类号 |
H01L29/78 |
代理机构 |
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地址 |
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