发明名称 SEALED THREE DIMENSIONAL METAL BONDED INTEGRATED CIRCUITS
摘要 The invention provides a sealing layer that seals metal bonding structures between three dimensional bonded integrated circuits from a surrounding environment. A material may be applied to fill a volume between the bonded integrated circuits or seal the perimeter of the volume between the bonded integrated circuits. The material may be the same material as that used for underfilling the volume between the bottom integrated circuit and a substrate.
申请公布号 US2007212815(A1) 申请公布日期 2007.09.13
申请号 US20070747846 申请日期 2007.05.11
申请人 MORROW PATRICK;KLOSTER GRANT 发明人 MORROW PATRICK;KLOSTER GRANT
分类号 H01L21/98;H01L21/50;H01L21/56;H01L23/02;H01L23/31;H01L23/48;H01L25/065 主分类号 H01L21/98
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