| 摘要 |
A method, system or switch device, the switch device having both switch and test capabilities. A method includes running in a test or switch mode or both; and, performing the testing operation or the switching operations, or both. Another method includes setting up the test functionality in the switch device, the test functionality including one or both of transmitting test data and receiving test data. Other steps may include initiating the transmission of test data; and checking the test data. A switch device may include an ASIC disposed within the switch device, the ASIC including one or both of an egress test block and an ingress test block; whereby the egress test block and the ingress test block are respectively adapted to transmit and receive a test packet; whereby the ASIC and one or both of the egress and ingress test blocks provide for alternatively operating in the conventional switch mode and in test mode.
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