发明名称 |
Verfahren und Vorrichtung zur Überprüfung von Gegenständen |
摘要 |
A method and apparatus for reducing speckle during inspection of articles used in the manufacture of semiconductor devices, including wafers, masks, photomasks, and reticles is disclosed. The coherence of a light beam output by a coherent light source, such as a pulsed laser, is reduced by disposing elements in a light path. Examples of such elements include optical fiber bundles; optical light guides; optical gratings; an integrating sphere; and an acousto-optic modulator. These various elements may be combined as desired, such that light beams output by the element combinations have optical path length differences that are greater than a coherence length of the light beam output by the coherent light source. <IMAGE> <IMAGE> |
申请公布号 |
DE60030658(T2) |
申请公布日期 |
2007.09.13 |
申请号 |
DE2000630658T |
申请日期 |
2000.11.16 |
申请人 |
APPLIED MATERIALS INC. |
发明人 |
KENAN, BOAZ;KARPOL, AVNER;REINHORN, SILVIU;ELYASAF, EMANUEL;YALOV, SHIMON |
分类号 |
G01B11/30;G01N21/47;G01N21/95;G01N21/956;G02B27/48;G03F1/00;G03F7/20;H01L21/027;H01L21/66 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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