发明名称 Thermophoretic Techniques for Protecting Reticles from Contaminants
摘要 Thermophoresis within lithography systems for protecting reticles from contaminants (e.g., floating particles). Generally, thermophoretic protection is implemented by maintaining the reticle at a higher temperature than its surrounding environment. Thermophoretic protection can be maintained throughout a reticle's use in a lithography system. For example, a reticle can be thermophoretically protected while in storage, through various stages of transportation via a reticle handler (also referred to as an end-effector), to its period of use while attached to a reticle chuck.
申请公布号 US2007211232(A1) 申请公布日期 2007.09.13
申请号 US20040578752 申请日期 2004.11.10
申请人 PHILLIPS ALTON H;SOGARD MICHAEL R;WATSON DOUGLAS C;TANAKA KEIICHI 发明人 PHILLIPS ALTON H.;SOGARD MICHAEL R.;WATSON DOUGLAS C.;TANAKA KEIICHI
分类号 G03B27/52;G03F7/20 主分类号 G03B27/52
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