发明名称 SEMICONDUCTOR DEVICE WITH CHARGE STORAGE PATTERN AND METHOD FOR FABRICATING THE SAME
摘要 A semiconductor device (e.g., a non-volatile memory device) with improved data retention characteristics includes active regions that protrude above a top surface of a device isolation region. A tunneling insulating layer is formed on the active regions. Charge storage patterns (e.g., charge trap patterns) are formed so as to be spaced apart from each other. A blocking insulating layer and a gate are formed on the charge storage patterns.
申请公布号 US2007212880(A1) 申请公布日期 2007.09.13
申请号 US20070683383 申请日期 2007.03.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK YOUNG-WOO;CHOI JUNG-DAL;SIM JAE-SUNG
分类号 H01L21/302 主分类号 H01L21/302
代理机构 代理人
主权项
地址