发明名称 PHASE-CHANGE RANDOM ACCESS MEMORY AND METHOD OF MANUFACTURING SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a phase-change random access memory the structure of which has been improved so that the adhesion of a phase-change substance layer is improved, and a method of manufacturing the same. <P>SOLUTION: A switching element and a storage node linked with the switching element are provided and the storage node is a phase-change random access memory having a bottom electrode, a top electrode, a phase-change substance layer interposed between the bottom electrode and the top electrode, and an adhesion interfacial layer interposed between the bottom electrode and the phase-change substance layer. The adhesion interfacial layer is formed from a Ge-N or Ge-O-N substance. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007235128(A) 申请公布日期 2007.09.13
申请号 JP20070036467 申请日期 2007.02.16
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 NOH JIN-SEO;KIM KI-JOON
分类号 H01L27/105;H01L27/10;H01L45/00 主分类号 H01L27/105
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