发明名称 MIM capacitor structure and fabricating method thereof
摘要 A method for fabricating an MIM capacitor is disclosed. First, a substrate is provided having a first dielectric layer thereon. Next at least one first damascene conductor is formed within the first dielectric layer, and a second dielectric layer with a capacitor opening is formed on the first dielectric layer, in which the capacitor opening is situated directly above the first damascene conductor. Next, an MIM capacitor having a top plate and a bottom plate is created within the capacitor opening, in which the bottom plate of the MIM capacitor is electrically connected to the first damascene conductor. Next, a third dielectric layer is deposited on the second dielectric layer and the MIM capacitor, and at least one second damascene conductor is formed within part of the third dielectric layer, in which the second damascene conductor is electrically connected to the top plate of the MIM capacitor.
申请公布号 US2007212845(A1) 申请公布日期 2007.09.13
申请号 US20070748481 申请日期 2007.05.14
申请人 LIN CHUN-YI;HUNG CHIEN-CHOU 发明人 LIN CHUN-YI;HUNG CHIEN-CHOU
分类号 H01L21/20 主分类号 H01L21/20
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