发明名称 EMI MEASURING METHOD OF EMI MEASURING CONTROLLER, EMI MEASURING CONTROLLER AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To solve such a problem that it takes time thus resulting in delay of development of a device since it is necessary to search the angle of a turntable, and the height and horizontality/perpendicularity of an antenna to achieve a maximum electric field strength for each frequency having the problems often requiring countermeasures as some of the frequencies exceed a standard value. SOLUTION: The initial values of a rotation start angle and a stop angle of the turntable 2c are set, the turntable 2c is returned to the rotation start angle of the initial value, a first display part of a measuring device 4A is set to the maximum value measurement, a second display part of the measuring device 4A is set to be a normal write-in state, a measurement frequency is set to the measuring device 4A to start EMI measurement, EMI measured data of the measuring device is read for each preset rotation angle while optimally adjusting the speed of the turntable and rotating the turntable according to a frequency range and band width used for measuring the turntable 2c, and the read EMI measured data is stored in a storage means. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007232600(A) 申请公布日期 2007.09.13
申请号 JP20060055689 申请日期 2006.03.02
申请人 FUJITSU LTD 发明人 NAKAMURA KEISUKE
分类号 G01R29/08 主分类号 G01R29/08
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