发明名称 |
Method for testing non-deterministic device data |
摘要 |
A method for testing semiconductor devices that output non-deterministic entity information such as packet and control signals is disclosed. The method includes the steps generating test signals with a semiconductor tester and applying the generated test signals to the device-under-test. Actual output entities from the DUT in response to the applied generated test signals are captured by the tester and compared to expected output entities. If a failure is identified in the comparing step, the method defines a window of valid expected entities and compares the failed actual output entity to the window of valid expected entities. If a match occurs between the failed actual output entity and any of the expected entities in the window, the actual entity is deemed valid.
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申请公布号 |
US2007214397(A1) |
申请公布日期 |
2007.09.13 |
申请号 |
US20070800620 |
申请日期 |
2007.05.07 |
申请人 |
TERADYNE, INC. |
发明人 |
PHELPS BRIAN;SCHERB JACOB;HOPS JONATHAN |
分类号 |
G01R31/28;G06F11/00;G06F11/263 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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