发明名称 PHOTOMASK, METHOD FOR MANUFACTURING SUCH PHOTOMASK AND PATTERN FORMING METHOD USING SUCH PHOTOMASK
摘要 On a permeable substrate (100), for instance, a mask pattern, which is composed of a light shielding section (101), and a first translucent section (104A) surrounded by a semi-light shielding section (102) are provided. The mask pattern is provided with a first pattern region and a second pattern region facing each other by having the semi-light shielding section (102) and the first translucent section (104A) in between.
申请公布号 WO2007102338(A1) 申请公布日期 2007.09.13
申请号 WO2007JP53604 申请日期 2007.02.27
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;MISAKA, AKIO 发明人 MISAKA, AKIO
分类号 G03F1/29;G03F1/32;G03F1/54;G03F1/68;H01L21/027 主分类号 G03F1/29
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