发明名称 |
PHOTOMASK, METHOD FOR MANUFACTURING SUCH PHOTOMASK AND PATTERN FORMING METHOD USING SUCH PHOTOMASK |
摘要 |
On a permeable substrate (100), for instance, a mask pattern, which is composed of a light shielding section (101), and a first translucent section (104A) surrounded by a semi-light shielding section (102) are provided. The mask pattern is provided with a first pattern region and a second pattern region facing each other by having the semi-light shielding section (102) and the first translucent section (104A) in between. |
申请公布号 |
WO2007102338(A1) |
申请公布日期 |
2007.09.13 |
申请号 |
WO2007JP53604 |
申请日期 |
2007.02.27 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;MISAKA, AKIO |
发明人 |
MISAKA, AKIO |
分类号 |
G03F1/29;G03F1/32;G03F1/54;G03F1/68;H01L21/027 |
主分类号 |
G03F1/29 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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