发明名称 CRYSTALLIZATION METHOD OF SEMICONDUCTOR FILM, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, AND LASER IRRADIATION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a crystallization method of a semiconductor film capable of suppressing in-plane fluctuation in the quality of the semiconductor film. SOLUTION: In the crystallization method of the semiconductor film, the semiconductor film 506 formed on a substrate 510 is irradiated with a first laser beam 503 which is incident on a bottom surface 510a of a substrate 510 and by a second laser beam 504 which is incident on the bottom surface 510a of the substrate 510 at an angle opposite that of the first laser beam 503 and oscillated by an oscillator differing from that of the first laser beam 503. Thus, part of the semiconductor film 506 is melted, and a portion of the semiconductor film 506 being melted is moved while the positions of irradiation of the first and the second laser beams 503, 504 and are being scanned approximately along the direction of slant for the first laser beam 503 or the second laser beam 504, thus crystallizing the semiconductor film 506. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007235118(A) 申请公布日期 2007.09.13
申请号 JP20070022864 申请日期 2007.02.01
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 TANAKA KOICHIRO
分类号 H01L21/20;H01L21/268;H01L21/336;H01L29/786 主分类号 H01L21/20
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