| 摘要 |
PROBLEM TO BE SOLVED: To more effectively and inexpensively correct a pixel defect of a solid-state imaging device. SOLUTION: A defect correcting apparatus is equipped with: defect detection sections 13, 18 each detecting a horizontal address and a defect level of a defective pixel row; a temperature detection sensor 19 for detecting a temperature of an imaging device; a storage section 16 for storing the sensitivity of the imaging device during defect detection processing, the horizontal address and defect level of the defective pixel row and the temperature of the imaging device; an arithmetic section 18 for calculating a forecasted defect level forecasted to be generated in the defective pixel row during imaging based on the sensitivity of the imaging device and the temperature of the imaging device during imaging and the defect level stored in the storage section; and a defect correction section which performs defect correction processing to subtract a signal of the forecasted defect level from a signal of the defective pixel row during imaging using the imaging device. COPYRIGHT: (C)2007,JPO&INPIT
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