| 摘要 |
An inspection apparatus includes a light source unit (16) which irradiates illumination light onto a hologram (10) of a medium (12) from a predetermined direction at which diffraction light from the hologram (10) is obtained, a first light receiving member (18) which receives the diffraction light from the hologram (10), a second light receiving member (20) which receives transmitted part of illumination light irradiated onto the hologram (10), having passed through the medium (12), and an identification processing unit (28,30) which identifies authenticity of the hologram (10) from the diffraction light received by the first light receiving member (18) and identifies a defect such as chipping, peeling-off, cut or wrinkle of the hologram (10) from the transmitted light received by the second light receiving member (20).
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