An apparatus for inspecting an integrated circuits chip is provided to perform an aligning process without releasing or separating a probe card by aligning the probe card. A probe card(144) is used for inspecting electrical characteristics of an integrated circuit chip which is formed on a wafer. A housing(110) includes a loading part on which the prove card is loaded. The housing further includes an internal space for performing an inspection process. An adjusting member(150) is used for adjusting one of a horizontal level and height of the probe card. The adjusting member includes a plurality of screws(152) installed rotatably at an installation part. A hole is formed at an edge of the probe card so that the probe card moves up and down by the rotation of the screws.
