发明名称 Transmission shear grating in checkerboard configuration for EUV wavefront sensor
摘要 A wavefront measurement system includes a source of electromagnetic radiation. An imaging system directs the electromagnetic radiation at an object plane that it uniformly illuminates. A first grating is positioned in the object plane to condition the radiation entering the input of a projection optic. A projection optical system projects an image of the first grating onto the focal plane. A second grating is positioned at the focal plane that receives a diffracted image of the object plane to form a shearing interferometer. A CCD detector receives the image of the pupil of the projection optical system through the projection optical system and the second grating that forms a fringe pattern if there are aberrations in the projection optical system. Phaseshift readout of fringe pattern can be accomplished by stepping the first grating in a lateral direction and reading each frame with the CCD detector.
申请公布号 US7268891(B2) 申请公布日期 2007.09.11
申请号 US20040750986 申请日期 2004.01.05
申请人 ASML HOLDING N.V. 发明人 POULTNEY SHERMAN K.
分类号 G01B9/02;G01B11/24;G01J9/02;G01M11/02;G02B5/18;G03F7/20;H01L21/027 主分类号 G01B9/02
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