发明名称 |
Test program debugger device, semiconductor test apparatus, test program debugging method and test method |
摘要 |
A test program debugging apparatus of the present invention includes a device under test simulator and a semiconductor testing apparatus simulator. Further, the semiconductor testing apparatus simulator includes: a verification range acquiring unit that acquires a verification range that is a range of commands to be verified among commands included in the test program; a command simplifying unit that simplifies non-setting commands other than setting commands for setting the device under test simulator, among non-verification range commands included in a non-verification range that is a range other than the verification range within the test program; and a command executing unit that executes the verification range commands included in the verification range, the setting commands, and the non-setting commands simplified by the command simplifying unit.
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申请公布号 |
US7269773(B2) |
申请公布日期 |
2007.09.11 |
申请号 |
US20050211162 |
申请日期 |
2005.08.24 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
HORI MITSUO;TADA HIDEKI;KATAOKA TAKAHIRO;SEKIGUCHI HIROYUKI;MUKAWA KAZUO |
分类号 |
G06F11/00;G06F11/22;G06F11/263 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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