发明名称 Structure for reduced gate capacitance in a JFET
摘要 A junction field effect transistor (JFET) with a reduced gate capacitance. A gate definition spacer is formed on the wall of an etched trench to establish the lateral extent of an implanted gate region for a JFET. After implant, the gate is annealed. In addition to controlling the final junction geometry and thereby reducing the junction capacitance by establishing the lateral extent of the implanted gate region, the gate definition spacer also limits the available diffusion paths for the implanted dopant species during anneal. Also, the gate definition spacer defines the walls of a second etched trench that is used to remove a portion of the p-n junction, thereby further reducing the junction capacitance.
申请公布号 US7268378(B1) 申请公布日期 2007.09.11
申请号 US20020158326 申请日期 2002.05.29
申请人 QSPEED SEMICONDUCTOR INC. 发明人 YU HO-YUAN;LIVA VALENTINO L.
分类号 H01L29/80;H01L29/74;H01L31/112 主分类号 H01L29/80
代理机构 代理人
主权项
地址