发明名称 Method and apparatus for removing polymer residue from semiconductor wafer edge and back side
摘要 A method for cleaning a semiconductor device has the steps of securing a wafer ( 16 ) with a modified chuck ( 11 ) and applying a cleaning solution ( 18 ) to the backside ( 20 ) of the wafer ( 16 ). The cleaning solution ( 18 ) is formulated to remove PTFE from the wafer ( 16 ). The cleaning solution ( 18 ) is applied to the edge ( 14 ) of the wafer ( 16 ) because of the characteristics of the modified chuck ( 11 ) to remove PTFE impurities that gather on the edge ( 14 ) of the wafer ( 16 ).
申请公布号 US7267726(B2) 申请公布日期 2007.09.11
申请号 US20030420228 申请日期 2003.04.22
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 XIA CHANGFENG
分类号 C23G1/02;B08B3/08;H01L21/00;H01L21/306 主分类号 C23G1/02
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