发明名称 |
Method and apparatus for removing polymer residue from semiconductor wafer edge and back side |
摘要 |
A method for cleaning a semiconductor device has the steps of securing a wafer ( 16 ) with a modified chuck ( 11 ) and applying a cleaning solution ( 18 ) to the backside ( 20 ) of the wafer ( 16 ). The cleaning solution ( 18 ) is formulated to remove PTFE from the wafer ( 16 ). The cleaning solution ( 18 ) is applied to the edge ( 14 ) of the wafer ( 16 ) because of the characteristics of the modified chuck ( 11 ) to remove PTFE impurities that gather on the edge ( 14 ) of the wafer ( 16 ).
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申请公布号 |
US7267726(B2) |
申请公布日期 |
2007.09.11 |
申请号 |
US20030420228 |
申请日期 |
2003.04.22 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
XIA CHANGFENG |
分类号 |
C23G1/02;B08B3/08;H01L21/00;H01L21/306 |
主分类号 |
C23G1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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