发明名称 Intelligent life testing methods and apparatus for leakage current protection
摘要 An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit. In one embodiment, the apparatus a trip mechanism state generator, a fault alarm generator, a ground fault simulation unit. In operation, the ground fault simulation unit generates a simulated ground fault signal during every positive half-wave of an AC power, the simulated ground fault signal is detected by the leakage current detection circuit, the leakage current detection circuit responsively generates a signal to turn a switching device into its conductive state so as to allow a current to pass therethrough, the passed current is converted into a DC voltage in accordance with a trip mechanism state generated by the trip mechanism state generator, the fault alarm circuit receives and analyzes the DC voltage and indicates whether a fault exists in the leakage current protection device.
申请公布号 US7268559(B1) 申请公布日期 2007.09.11
申请号 US20060588046 申请日期 2006.10.26
申请人 GENERAL PROTECHT GROUP, INC. 发明人 CHEN WUSHENG;WANG FU;WANG LIANYUN
分类号 G01R31/08 主分类号 G01R31/08
代理机构 代理人
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