发明名称 AC coupled line testing using boundary scan test methodology
摘要 An AC boundary scan cell is disclosed. For one embodiment the AC boundary scan cell includes a first multiplexer, a second multiplexer, a first data shift register, a second data register, an XOR logic gate, and a third multiplexer. For one such embodiment the AC boundary scan cell includes an SDI line, an SDO line, a TDI line, a TDO line, a ShiftDR signal input line, an AC_Pattern_Clock or ClockDR signal input line, an UpdateDR signal input line, and a Mode signal input line. The AC boundary scan cell also includes an AC_Pattern_Source signal input line and an AC_Test signal input line. For one such embodiment, each line is coupled to receive the corresponding signal from the boundary scan logic.
申请公布号 US7269770(B1) 申请公布日期 2007.09.11
申请号 US20070654291 申请日期 2007.01.16
申请人 CISCO TECHNOLOGY, INC. 发明人 CHUNG SUNG SOO;BAEG SANG HYEON
分类号 G01R31/28 主分类号 G01R31/28
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