发明名称 SPUTTERING APPARATUS AND FILM FORMING METHOD THEREOF
摘要 <p>This invention relates to a sputtering apparatus and a film forming method thereof, more specifically, a technology for suitably controlling distribution characteristics of magnetron plasma in the vicinity of the surface of a target, based on magnetron discharge. In the method for forming films in the sputtering apparatus (100), a target (13) in a vacuum chamber (10) is sputtered by magnetron plasma using a discharge gas. In the method, a power supplied to the target (13) is kept constant, and a discharge gas quantity in the vacuum chamber (10) is adjusted, based on an index indicating the distribution characteristics of the magnetron plasma.</p>
申请公布号 WO2007099780(A1) 申请公布日期 2007.09.07
申请号 WO2007JP52731 申请日期 2007.02.15
申请人 SHINMAYWA INDUSTRIES, LTD.;FURUTSUKA, TAKESHI;KONDO, TAKAHIKO 发明人 FURUTSUKA, TAKESHI;KONDO, TAKAHIKO
分类号 C23C14/34 主分类号 C23C14/34
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