发明名称 |
SPUTTERING APPARATUS AND FILM FORMING METHOD THEREOF |
摘要 |
<p>This invention relates to a sputtering apparatus and a film forming method thereof, more specifically, a technology for suitably controlling distribution characteristics of magnetron plasma in the vicinity of the surface of a target, based on magnetron discharge. In the method for forming films in the sputtering apparatus (100), a target (13) in a vacuum chamber (10) is sputtered by magnetron plasma using a discharge gas. In the method, a power supplied to the target (13) is kept constant, and a discharge gas quantity in the vacuum chamber (10) is adjusted, based on an index indicating the distribution characteristics of the magnetron plasma.</p> |
申请公布号 |
WO2007099780(A1) |
申请公布日期 |
2007.09.07 |
申请号 |
WO2007JP52731 |
申请日期 |
2007.02.15 |
申请人 |
SHINMAYWA INDUSTRIES, LTD.;FURUTSUKA, TAKESHI;KONDO, TAKAHIKO |
发明人 |
FURUTSUKA, TAKESHI;KONDO, TAKAHIKO |
分类号 |
C23C14/34 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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