发明名称 |
CLEANING COMPOSITION, METHOD FOR CLEANING SEMICONDUCTOR SUBSTRATE, AND PROCESS FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
A stripping composition used after chemical mechanical polishing is provided to remove contaminants from a wafer surface after chemical mechanical polishing of the wafer while causing no corrosion of a metal interconnection, and to produce a high-quality semiconductor device with no impurities. A stripping composition used after chemical mechanical polishing comprises: (A) organic polymer particles having a crosslinked structure; and (B) a surfactant. Particularly, the organic polymer particles having a crosslinked structure has at least one functional group selected from the group consisting of carboxyl, hydroxyl, amino, sulfonate and -N+R3 groups (wherein R represents H or a C1-C4 alkyl group).
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申请公布号 |
KR20070091095(A) |
申请公布日期 |
2007.09.07 |
申请号 |
KR20070085661 |
申请日期 |
2007.08.24 |
申请人 |
JSR CORPORATION |
发明人 |
KONNO TOMOHISA;KUBOTA KIYONOBU;HATTORI MASAYUKI;KAWAHASHI NOBUO |
分类号 |
C11D11/00;B08B1/04;B08B3/08;C11D3/37;H01L21/02;H01L21/306;H01L21/3105;H01L21/321 |
主分类号 |
C11D11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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