发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 <p>A semiconductor device and its fabricating method are provided to enhance a channel area and a short channel effect by reducing a leakage current flowing from a storage electrode to a body. An active region comprising a storage electrode junction region and a channel region is defined by an isolation structure(130). A recess channel region has a vertical SOI(Silicon-On-Insulator) channel structure which is formed on a sidewall of the isolation structure. A gate insulating layer(160) is formed on the substrate comprising the recess channel region. A gate electrode(165) is formed on the gate insulating layer to bury the recess channel region.</p>
申请公布号 KR100756809(B1) 申请公布日期 2007.09.07
申请号 KR20060038825 申请日期 2006.04.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHUNG, SUNG WOONG;LEE, SANG DON
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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