发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
<p>A semiconductor device and its fabricating method are provided to enhance a channel area and a short channel effect by reducing a leakage current flowing from a storage electrode to a body. An active region comprising a storage electrode junction region and a channel region is defined by an isolation structure(130). A recess channel region has a vertical SOI(Silicon-On-Insulator) channel structure which is formed on a sidewall of the isolation structure. A gate insulating layer(160) is formed on the substrate comprising the recess channel region. A gate electrode(165) is formed on the gate insulating layer to bury the recess channel region.</p> |
申请公布号 |
KR100756809(B1) |
申请公布日期 |
2007.09.07 |
申请号 |
KR20060038825 |
申请日期 |
2006.04.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHUNG, SUNG WOONG;LEE, SANG DON |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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