发明名称 SEMICONDUCTOR DEVICE, AND ITS MANUFACTURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device including an n-channel and a p-channel transistors which is improved in performance by using stress. <P>SOLUTION: The semiconductor device comprises a semiconductor substrate formed of a first semiconductor material; an n-channel field effect transistor including an n-type source/drain region which is formed of a second semiconductor material different from the first one and is formed in the semiconductor substrate; and a p-channel field effect transistor including a p-type source/drain region which is formed of a third semiconductor material different from the first one, and is formed in the semiconductor substrate. The second and third semiconductor materials are different materials. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007227565(A) 申请公布日期 2007.09.06
申请号 JP20060045740 申请日期 2006.02.22
申请人 FUJITSU LTD 发明人 KIN EISOKU;SHIMAMUNE YOSUKE
分类号 H01L21/8238;H01L27/092;H01L29/78 主分类号 H01L21/8238
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