发明名称 |
SEMICONDUCTOR DEVICE, AND ITS MANUFACTURING METHOD |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device including an n-channel and a p-channel transistors which is improved in performance by using stress. <P>SOLUTION: The semiconductor device comprises a semiconductor substrate formed of a first semiconductor material; an n-channel field effect transistor including an n-type source/drain region which is formed of a second semiconductor material different from the first one and is formed in the semiconductor substrate; and a p-channel field effect transistor including a p-type source/drain region which is formed of a third semiconductor material different from the first one, and is formed in the semiconductor substrate. The second and third semiconductor materials are different materials. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
申请公布号 |
JP2007227565(A) |
申请公布日期 |
2007.09.06 |
申请号 |
JP20060045740 |
申请日期 |
2006.02.22 |
申请人 |
FUJITSU LTD |
发明人 |
KIN EISOKU;SHIMAMUNE YOSUKE |
分类号 |
H01L21/8238;H01L27/092;H01L29/78 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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