发明名称 |
Photoelectron Measuring Device |
摘要 |
To provide a photoelectron measuring device that enables handling of samples in the atmosphere. A photoelectron measuring device that emits ultraviolet light from an ultraviolet light generating source 1 onto a sample S while changing the wavelength and detects the wavelength at which photoelectrons start to be discharged from the sample S, with the section up to an emission outlet 2 being housed in a non-oxygen environment and a sample stand 4 being disposed so that the distance from the emission outlet 2 to the sample S is 7 mm or less.
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申请公布号 |
US2007205363(A1) |
申请公布日期 |
2007.09.06 |
申请号 |
US20050592529 |
申请日期 |
2005.03.11 |
申请人 |
RIKEN KEIKI CO., LTD |
发明人 |
NAKAJIMA YOSHIYUKI;YAMASHITA DAISUKE |
分类号 |
G01N23/227;G01T1/16;G21K1/06;G21K5/02 |
主分类号 |
G01N23/227 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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