发明名称 Photoelectron Measuring Device
摘要 To provide a photoelectron measuring device that enables handling of samples in the atmosphere. A photoelectron measuring device that emits ultraviolet light from an ultraviolet light generating source 1 onto a sample S while changing the wavelength and detects the wavelength at which photoelectrons start to be discharged from the sample S, with the section up to an emission outlet 2 being housed in a non-oxygen environment and a sample stand 4 being disposed so that the distance from the emission outlet 2 to the sample S is 7 mm or less.
申请公布号 US2007205363(A1) 申请公布日期 2007.09.06
申请号 US20050592529 申请日期 2005.03.11
申请人 RIKEN KEIKI CO., LTD 发明人 NAKAJIMA YOSHIYUKI;YAMASHITA DAISUKE
分类号 G01N23/227;G01T1/16;G21K1/06;G21K5/02 主分类号 G01N23/227
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