| 摘要 |
PROBLEM TO BE SOLVED: To perform hardware diagnosis for a disk array device in the same condition as an actual machine before shipping the disk array device by utilizing a self-diagnostic circuit. SOLUTION: A self-diagnostic circuit 22 is mounted on an LSI 10 besides a logic circuit 18. Before shipping, a test program is loaded to a RAM 28, and when a diagnosis instruction is input to a CPU 26, not only a pattern but also expected value pattern data corresponding to the pattern are generated in a pattern generation circuit 24 by control of the CPU 26, and are input to the logic circuit 18, and then, the logic circuit 18 is operated in accordance with the pattern and outputs pattern data showing a test result. This pattern data is compared/collated with the expected value pattern data in an expected value collation circuit 30, and a diagnosis result relating to abnormality of the logic circuit 18 is output from the expected value collation circuit 30, and contents of the diagnosis result are displayed on an external display device. COPYRIGHT: (C)2007,JPO&INPIT
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