发明名称 LATTICE-LIKE ARRAY PROBE ASSEMBLY
摘要 PROBLEM TO BE SOLVED: To provide a mechanism for assembling plane array type contactor that solves the reduction of space of an input terminal in contact with a pad of the probe and can secure occupied space of an appropriate deformation part when the circuit terminal interval becomes small like an electronic circuit constituted in an integrated circuit or the like. SOLUTION: A thin-plate-like contactor is arranged inclinedly by a certain angle with respect to the lattice coordinate axis of a circuit terminal of a tested circuit, the tip of a parallel spring holds space of a length over a plurality of pitches of the lattice, there is no interference with other contactors, certain width and length are kept in the deformation operation direction, the operation at the tip of the probe is provided by the parallel spring, vertical operation is enabled, a material long in the lateral direction also can be picked, and the material picking space getting involved with deflection is increased. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007225581(A) 申请公布日期 2007.09.06
申请号 JP20060081729 申请日期 2006.02.22
申请人 KIMOTO ISAO 发明人 KIMOTO ISAO
分类号 G01R1/073;G01R31/26;H01L21/66 主分类号 G01R1/073
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