发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, PLASMA PROCESSING APPARATUS, AND STORAGE MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To protect carbon from separation from the exposed surface of a recess area due to the plasma used for the ashing when such ashing of a resist film at the upper part of a SiOCH film is conducted to a wafer having the SiOCH film to which the recess area is formed by the etching process. SOLUTION: A protection film for protecting an exposed area of the recess area of the SiOCH film is deposited from the plasma used for the ashing, by converting the CH<SB>4</SB>gas into the plasma before the ashing process and then depositing a sediment to the exposed area of the recess area of the SiOCH film using the plasma. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007227529(A) |
申请公布日期 |
2007.09.06 |
申请号 |
JP20060045298 |
申请日期 |
2006.02.22 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
NISHIMURA EIICHI;KIHARA YOSHIHIDE;INADA YASUSHI;HAYASHI MASUYOSHI |
分类号 |
H01L23/522;H01L21/768 |
主分类号 |
H01L23/522 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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