发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, PLASMA PROCESSING APPARATUS, AND STORAGE MEDIUM
摘要 PROBLEM TO BE SOLVED: To protect carbon from separation from the exposed surface of a recess area due to the plasma used for the ashing when such ashing of a resist film at the upper part of a SiOCH film is conducted to a wafer having the SiOCH film to which the recess area is formed by the etching process. SOLUTION: A protection film for protecting an exposed area of the recess area of the SiOCH film is deposited from the plasma used for the ashing, by converting the CH<SB>4</SB>gas into the plasma before the ashing process and then depositing a sediment to the exposed area of the recess area of the SiOCH film using the plasma. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007227529(A) 申请公布日期 2007.09.06
申请号 JP20060045298 申请日期 2006.02.22
申请人 TOKYO ELECTRON LTD 发明人 NISHIMURA EIICHI;KIHARA YOSHIHIDE;INADA YASUSHI;HAYASHI MASUYOSHI
分类号 H01L23/522;H01L21/768 主分类号 H01L23/522
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