Interferometric Measuring Device

摘要

An interferometric measuring device for the three-dimensional measurement of shapes on objects to be measured having a beam splitter receiving light from a light source via an input light path and splitting it into a measuring light path and a reference light path, having an image pick-up, to which light reflected back from the object to be measured and from a reference and brought into interference can be supplied via an output light path for conversion into electrical signals, having an evaluation unit for determining the surface shape from the signals and having an adaptation device for adapting the light intensity or the signals received from the interfering light. The measuring precision is increased by the fact that the measuring device is configured to measure planar regions of the surface which extend over at least the lateral resolution of the measuring device and that the adaptation device is configured for adjusting the intensity of the light and/or of the signals obtained from the light as a function of locally varying reflective properties of the surface with respect to the measuring optics.