摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device using a microchip, which provides high reliability when making total judgement, based on detection results in a plurality of detected parts on the microchip, or when comparing the results in the plurality of detected parts, or when executing the like. SOLUTION: This inspection device has: a microchip storage part for storing the microchip having the plurality of detected parts; a light source for emitting light to the plurality of detected parts of the microchip stored in the microchip storage part; and a single photoreception part for receiving the light from the light source via the plurality of detected parts of the microchip stored in the microchip storage part. COPYRIGHT: (C)2007,JPO&INPIT
|