| 摘要 |
PROBLEM TO BE SOLVED: To provide an internal testing system (inspection) for an electronic device and a sub-system in a hard disk system. SOLUTION: A system 60 is provided with a hard disk controller (HDC) module 37 controlling the hard disk and a read channel (RC) device 25 communicating with the HDC module 37 via a read bus and a write bus.The RC device 25 has a loopback circuit looping back selectively the write bus to the read bus. The RC device generates a write clock for the HDC module 37 to write data on the write bus and a read clock for the HDC module 37 to read the data on the read bus. The write clock is independent of the read clock. COPYRIGHT: (C)2007,JPO&INPIT
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