发明名称 |
Semiconductor apparatus for monitoring critical path delay characteristics of a target circuit |
摘要 |
A semiconductor apparatus for flexibly and effectively configuring a delay monitor circuit without an increase in circuit scale includes a delay signal generation circuit for switching the configuration of delay element arrays based on first configuration information and second configuration information and propagating a delay element array wherein a pulse is switched, a register group having a first register for the first configuration information and a second register for second configuration information, a selector for outputting to the delay signal generation circuit the first configuration information and second configuration information in accordance with an instruction of a selection signal in a time sharing way, and a control circuit for controlling a power source voltage based on delay information of a delay element array and outputting to the selector a selection signal to select from the first configuration information and second configuration information in a time sharing way.
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申请公布号 |
US7265590(B2) |
申请公布日期 |
2007.09.04 |
申请号 |
US20030713365 |
申请日期 |
2003.11.14 |
申请人 |
SONY CORPORATION |
发明人 |
SEKI TAKAHIRO;NAKAI MASAKATSU;MEGURO TETSUMASA |
分类号 |
H01L27/04;H03K5/19;H01L21/822;H03H11/26;H03K5/00;H03K5/14;H03L7/081 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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