发明名称 Methods for fabricating memory devices using sacrificial layers
摘要 A protection layer is formed on a semiconductor substrate having a cell array region and an alignment key region. A plurality of data storage elements are formed on the protection layer in the cell array region. An insulating layer is formed on the data storage elements, a barrier layer is formed on the insulating layer, and a sacrificial layer is formed on the barrier layer. The sacrificial layer, the barrier layer and the insulating layer are patterned to form contact holes that expose the data storage elements, and conductive plugs are formed in the contact holes. The sacrificial layer is etched to leave portions of the conductive plugs protruding from the barrier layer. The protruding portions of the conductive plugs are removed by polishing.
申请公布号 US7265050(B2) 申请公布日期 2007.09.04
申请号 US20040999103 申请日期 2004.11.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI SUK-HUN;SON YOON-HO;CHO SUNG-LAE;PARK JOON-SANG
分类号 H01L21/00;H01L21/4763;H01L21/768;H01L27/24;H01L29/40 主分类号 H01L21/00
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