发明名称 Method and apparatus for measuring assembly and alignment errors in sensor assemblies
摘要 A target, method, and apparatus are disclosed for measuring assembly and alignment errors in scanner sensor assemblies. The sensor assembly comprises at least two sensor segments. The target comprises edges defined by changes in reflectance. At least one vertical edge corresponds to each sensor segment, and can be detected only by its corresponding segment, even when the segments are misaligned to the maximum extent of their placement tolerances. The target may optionally comprise a horizontal edge spanning the sensor segments. The target is scanned, and the resulting digital image is analyzed to detect the apparent locations of the target edges. The apparent edge locations provide sufficient information to locate the sensor segments. The target may optionally be incorporated into a scanner, or into a separate alignment fixture. The analysis may be performed in a scanner, in a fixture, or in a host computer attached to a scanner or a fixture.
申请公布号 US7265881(B2) 申请公布日期 2007.09.04
申请号 US20020326622 申请日期 2002.12.20
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 HARRIS RODNEY C.;SPEARS KURT E.
分类号 H04N1/028;H04N1/46;H04N1/00;H04N1/047;H04N1/10;H04N1/193 主分类号 H04N1/028
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