发明名称 Structure and method for dual-gate FET with SOI substrate
摘要 A method of forming a dual gate fin-type field effect transistor (FinFET) structure patterns silicon fins over an insulator and patterns a gate conductor at an angle to the fins. The gate conductor is formed laterally adjacent to and over center portions of the fins. The gate conductor is planarized such that the gate conductor is separated into distinct gate conductor portions that are separated by the fins. These gate conductor portions include front gates and back gates. The front gates and the back gates alternate along the structure, such that each fin has a front gate on one side and a back gate on the opposite side. Then front gate wiring is formed to the front gates and back gate wiring is formed to the back gates.
申请公布号 US7265005(B2) 申请公布日期 2007.09.04
申请号 US20050265464 申请日期 2005.11.02
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 NOWAK EDWARD J.;WILLIAMS RICHARD Q.
分类号 H01L21/338 主分类号 H01L21/338
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