发明名称 Semiconductor integrated circuit
摘要 Fuse data is supplied to each of a plurality of function blocks through a transfer path using shift registers. When the reliability of fuse elements is low, there is a possibility that a part of the fuse data may have an error. Further, when the transfer path of the fuse data is long, there is a possibility that a value of the fuse data may be inverted due to an influence of noises. Thus, a decoder is arranged in the transfer path of the fuse data, and encoded data is stored in the fuse elements. By performing error detection/correction in the decoder, the high reliability is assured with respect to chip operations and the like.
申请公布号 US7266025(B2) 申请公布日期 2007.09.04
申请号 US20030726544 申请日期 2003.12.04
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NAGAI TAKESHI;HAGA RYO
分类号 G11C11/413;G11C17/18;G11C11/401;G11C29/02;G11C29/04;H01L21/82;H03M13/19 主分类号 G11C11/413
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